Scanning Electron Microscope

Scanning Electron Microscope

Electron Gun: Tungsten heated cathode
Magnification: 3x to 1,000,000x (for 5’’ image width in Continual Wide Field/Resolution)
Maximum Field of View: 24 mm at WD 30 mm
Accelerating Voltage: 200 V to 30 kV
Probe Current: 1 pA to 2 µA
Scanning Speed: From 20 ns to 10 ms per pixel adjustable in steps or continuously

Scanning Features:
Point & Line Scan, Focus Window – shape, size and position continuously adjustable, Dynamic Focus – in plane or folded plane tilted up to ±70
Deg, Image rotation, Image shift, Tilt compensation, 3D Beam –defined tilting scanning axis around XY axis, Live Stereoscopic Imaging, Other scanning shapes available through the Draw Beam software

Image File format:
BMP, TIFF, JPEG (Selectable)

Control:
Computer (PC) interface

Accessories:
Computer, LCD Display